Block-copolymer self-assembly (BCP SA) patterns have been intensively studied over more than past

30 years. In recent years, BCP SA patterns as nano-scale templates have been applied in various fields

including microelectronics and catalytic materials as well as photonic or plasmonic sub-wavelength

patterns. Nevertheless, the disorder and defects inherent in BCP SA prevent the wide and active

applications which require a reproducible and scalable manner of production. The disorder and defects

inherent in BCP SA are typically generated by thermal noise or uncontrollable factors in the fabrication

process. As important as controlling these BCA SA defects is to precisely estimate the disorder and

quantitatively measure the defects. For this purpose, mathematical and information-theoretically

provable methods can be used. In addition, the defects and disorder can be applied to new fields. For

example, it can be used as information security media such as physically unclonable function (PUF) or

true random number generator (TRNG). For this, it is also required to precisely measure the information

of defects and disorder and convert them into a reproducible information-carrying media. In this seminar,

such measurement algorithms and methods for BCP SA disorder and defects and their applications will

be discussed. Through this, we can explore the potential as a new security material beyond the existing